Notre Dame Integrated Imaging Facility

Electron Microscopy

Laboratory of Advanced Electron Microscopy (LAEM)
 

 

  • Scanning  Electron Microscope: EVO-50 (Carl Zeiss)
  • Field Emission Scanning Electron Microscope Magellan 400 (FEI)
  • SEM/FIB Workstation: Helios Nano Lab Dual Beam 600 (FEI)
  • Transmission Electron Microscope: JEOL 2011T (JEOL)  
  • Transmission Electron Microscope: Titan (FEI)
  • As well as  several sample preparation devices


 

Location       Contacts       Rates
 

Tel: (574) 631-9825 
E-mail: A.Mukasyan@nd.edu

 

FIB - Helios Nano Lab Dual Beam 600 (FEI)Magellan 400 (FEI)Transmission Electron Microscope - Titan (FEI)