Notre Dame Integrated Imaging Facility

CAMECA SX-50 ELECTRON MICROPROBE

Function:  The Cameca electron microprobe allows chemical analysis of flat, polished samples for Boron and heavier elements.  The instrument includes an electron column providing a focused electron beam of less than a micron in size.  X-rays are detected either by Energy Dispersive or Wavelength Dispersive spectrometers.  A library of standards allows quantitative analyses.  Detection limits range from ~50 ppm to ~400 ppm depending on atomic number and matrix.  Beam/Stage scanning allow collection of elemental images with micron resolution.

Cameca SX-50 Electron Microprobe

Cameca SX-50 Electron Microprobe