Notre Dame Integrated Imaging Facility

JEOL JEM2011 TEM

• Operating voltage of 80 – 200 kV

h300_jeol

• Analytical Pole Piece with point-to-point

  resolution of 0.2 nm.

• Magnification from 50x – 1, 500, 000

• JEOL Single Tilt Holder

• Gatan Be Double Tilt Holder

• AMT bottom-mount camera

• Oxford INCA 30 mm2 LN2 Energy Dispersive X-ray Spectroscopy (EDS) detector

 

The major capabilities of Jeol JEM2011 microscope include, but are not limited to:

  • TEM Imaging on atomic level (with Angstrom level resolution)

  • Selected Area (SAD), Coverging Beam (CBED) and Nano (ND) Electron Diffraction for crystal structure analysis

  •  Bright-field and Dark-filed Imaging in TEM

  •  Chemical composition analysis with EDS

Typical TEM images taken by Jeol JEM2011

h300_2_cdte_mzh

 

CdTe Nano-wires

 

Courtesy of Dr. Maksym Zhukovskyi & Prof. Masaru Kuno, Department of Chemistry and Biochemistry

 

h300_3_julia1_ca_cells_004

 

Cancer Cell

 

 

 

 

Courtesy of Yuliya Klymenko & Prof. Sharon Stack, Department of Biological Sciences

 

For information about Jeol JEM2011 microscope or training schedule, please, contact Dr. S. Rouvimov